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Conference record
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| Genre | |
|---|---|
| Other Titles |
Systems Readiness: Test Technology for the 21st Century. Conference Record IEEE Autotestcon |
| Language |
English |
| Item Description |
Each vol. has also a distinctive title. |
| Publisher |
[New York, N.Y.] :
Institute of Electrical and Electronics Engineers
|
| Classification | |
| Dewey Classification |
629 |
| Subjects | |
| Additional Information | Autotestcon |
| Subseries |
2012 IEEE AUTOTESTCON Proceedings 2008 IEEE AUTOTESTCON 2009 IEEE AUTOTESTCON AUTOTESTCON, 2013 IEEE 2006 IEEE Autotestcon 2010 IEEE AUTOTESTCON 2011 IEEE AUTOTESTCON Autotestcon, 2007 IEEE |
| Additional form |
1088-7725 |
| Publish date |
Print began with 1995; ceased with 1996. |
| Publication Frequency |
Annual |
| ISSN |
1558-4550 |
| Source of Acquisition |
IEEE Service Center, 445 Hoes Lane, P.O. Box 1331, Piscataway, NJ 08855-1331 |
| Notes |
Sponsored by the Institute of Electrical and Electronics Engineers, Aerospace and Electronics Systems Society, Instrumentation and Measurement Society |
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