IEEE International Conference on Computational Intelligence for Measurement Systems and Applications : [proceedings]

Get full text

eSerial

Institute of Electrical and Electronics Engineers

Saved in:

Genre

Conference papers and proceedings

Other Titles

International Conference on Computational Intelligence for Measurement Systems and Applications
Computational intelligence for measurement systems and applications
CIMSA proceedings

Language

English

Publisher

Piscataway, N.J. : Institute of Electrical and Electronics Engineers

Classification

dlc ISSN RECORD

Dewey Classification

006

Subjects

Computational intelligence → Industrial applications → Congresses.

Neural networks (Computer science) → Congresses.

Fuzzy systems → Congresses.

Soft computing → Congresses.

Automatic control → Data processing → Congresses.

Measurement → Congresses.

Automatic control → Data processing.

Computational intelligence → Industrial applications.

Fuzzy systems.

Measurement.

Neural networks (Computer science)

Soft computing.

Subseries

2011 IEEE International Conference on Computational Intelligence for Measurement Systems and Applications (CIMSA) Proceedings
2012 IEEE International Conference on Computational Intelligence for Measurement Systems and Applications (CIMSA) Proceedings

Additional form

2159-1547

Continued by

Computational Intelligence and Virtual Environments for Measurement Systems and Applications, IEEE International Conference on
... IEEE International Conference on Computational Intelligence and Virtual Environments for Measurement Systems and Applications

Publish date

Began in 2004; ceased in 2012.

ISSN

2159-1555

Source of Acquisition

IEEE, 445 Hoes Ln. Piscataway NJ 08854

Get full text

IEEE International Conference on Computational Intelligence for Measurement Systems and Applications : [proceedings]

IEEE International Conference on Computational Intelligence for Measurement Systems and Applications : [proceedings]

Material provided by

Material provided by

Search

IEEE International Conference on Computational Intelligence for Measurement Systems and Applications : [proceedings]

IEEE International Conference on Computational Intelligence for Measurement Systems and Applications : [proceedings]

Material provided by

Material provided by