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Proceedings
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Proceedings
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eSerial
IEEE Computer Society. Technical Council on Test Technology
;
IEEE Computer Society. Design Automation Technical Committee
IEEE Computer Society
Saved in:
Genre
Conference papers and proceedings
Language
English
Publisher
Los Alamitos, Calif. :
IEEE Computer Society
Classification
dlc TK7874.58 I444 (Online)
Dewey Classification
621
Subjects
Integrated circuits
→
Verification
→
Congresses.
Integrated circuits
→
Design and construction
→
Congresses.
Electronic circuits
→
Testing
→
Congresses.
Microprocessors
→
Testing
→
Congresses.
Electronic circuits
→
Testing.
Integrated circuits
→
Design and construction.
Integrated circuits
→
Verification.
Microprocessors
→
Testing.
Additional Information
IEEE International High-Level Validation and Test Workshop
Subseries
2010 IEEE International High Level Design Validation and Test Workshop (HLDVT)
2011 IEEE International High Level Design Validation and Test Workshop
2012 IEEE International High Level Design Validation and Test Workshop (HLDVT)
2007 IEEE International High Level Design Validation and Test Workshop
2008 IEEE International High Level Design Validation and Test Workshop
High Level Design Validation and Test Workshop, 2009. HLDVT 2009. IEEE International
High-Level Design Validation and Test Workshop, 2006. Eleventh Annual IEEE International
Additional form
1552-6674
Publish date
Began in 1996.
Publication Frequency
Annual
Notes
Vols. for 2001-2006 also called: 7th-11th
Sponsored by: IEEE Computer Society Technical Council on Test Technology <2000-2008>; IEEE Computer Society Technical Committee on Design Automation, <2000-2008>
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