Records of the IEEE International Workshop on Memory Technology, Design, and Testing
Finna-arvio
Records of the IEEE International Workshop on Memory Technology, Design, and Testing
Tallennettuna:
| Genre | |
|---|---|
| Muut nimekkeet |
Memory Technology, Design, and Testing ... IEEE International Workshop on Memory Technology, Design and Testing (MDTD) |
| Kieli |
englanti |
| Julkaisija |
Los Alamitos, Calif. :
IEEE Computer Society Press
|
| Luokitus | |
| Dewey-luokitus |
004 |
| Aiheet | |
| Lisätiedot | sponsored by the IEEE Computer Society Technical Committee on Test Technology ; in cooperation with the IEEE Computer Society Technical Committee on VLSI |
| Alasarja |
2007 IEEE International Workshop on Memory Technology, Design and Testing |
| Muu ilmiasu |
1087-4852 |
| Julkaistu |
Began with: Aug. 8-9 (1994) |
| Julkaisutiheys |
Annual |
| Järjestelmävaatimukset |
Master and use copy. Digital master created according to Benchmark for Faithful Digital Reproductions of Monographs and Serials, Version 1. Digital Library Federation, December 2002 |
| ISSN |
2576-9154 |
| Hankintapaikka |
IEEE Service Center, 445 Hoes Lane, Piscataway, NJ 08854 |
| Hae kokoteksti | |