International Conference on Test and Measurement : [proceedings]

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Institute of Electrical and Electronics Engineers ; IEEE Instrumentation and Measurement Society

Institute of Electrical and Electronic Engineers

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Genre

Conference papers and proceedings

Other Titles

Proceedings ... International Conference on Test and Measurement
ICTM
Conference on Test and Measurement

Language

English

Publisher

Piscataway, NJ : Institute of Electrical and Electronic Engineers

Classification

dlc ISSN RECORD

Dewey Classification

621.381

Subjects

Electronic apparatus and appliances → Testing → Congresses.

Operating systems (Computers) → Congresses.

Information technology → Congresses.

Electronic apparatus and appliances → Testing.

Information technology.

Operating systems (Computers)

Additional form

2157-5592

Publication Frequency

Annual

ISSN

2157-5606

Source of Acquisition

Institute of Electrical and Electronics Engineers, IEEE Service Center, 445 Hoes Lane, Piscataway, NJ 08854

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