IEEE Circuits and Systems International Conference on Testing and Diagnosis : ICTD

Hae kokoteksti

E-kausijulkaisu

Institute of Electrical and Electronics Engineers ; IEEE Circuits and Systems Society

IEEE

Tallennettuna:

Genre

Conference papers and proceedings

Kieli

englanti

Julkaisija

[Piscataway, N.J.] : IEEE

Luokitus

dlc ISSN RECORD

Dewey-luokitus

621.3815

Aiheet

Electronic circuits → Testing → Congresses.

Computer programs → Testing → Congresses.

Automatic test equipment → Congresses.

Automatic test equipment.

Computer programs → Testing.

Electronic circuits → Testing.

Muu ilmiasu

2324-8475

Hankintapaikka

Institute of Electrical and Electronics Engineers, IEEE Service Center, 445 Hoes Lane, Piscataway, NJ 08854

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