IEEE Circuits and Systems International Conference on Testing and Diagnosis : ICTD

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Institute of Electrical and Electronics Engineers ; IEEE Circuits and Systems Society

IEEE

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Genre

Conference papers and proceedings

Language

English

Publisher

[Piscataway, N.J.] : IEEE

Classification

dlc ISSN RECORD

Dewey Classification

621.3815

Subjects

Electronic circuits → Testing → Congresses.

Computer programs → Testing → Congresses.

Automatic test equipment → Congresses.

Automatic test equipment.

Computer programs → Testing.

Electronic circuits → Testing.

Additional form

2324-8475

Source of Acquisition

Institute of Electrical and Electronics Engineers, IEEE Service Center, 445 Hoes Lane, Piscataway, NJ 08854

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